高等学校化学学报

高等学校化学学报 ›› 2004, Vol. 25 ›› Issue (7): 1314.

• 研究论文 • 上一篇    下一篇

金属纳米颗粒-聚电解质多层膜的X射线反射率研究

李秀宏1, 谭智敏2, 黄兰2, 李晓龙1, 麦振洪1, 李明1   

  1. 1. 中国科学院物理研究所, 北京 100080;
    2. 北京大学化学与分子工程学院, 北京 100871
  • 收稿日期:2003-06-17 出版日期:2004-07-24 发布日期:2004-07-24
  • 通讯作者: 李明(1967年出生),男,博士,研究员,主要从事软物质基质中的分子组装、薄膜生长动力学、固液界面有机多层膜结构和热力学性质研究.E-mail:mingli@aphy.iphy.ac.cn E-mail:mingli@aphy.iphy.ac.cn
  • 基金资助:

    国家自然科学基金(批准号:10274096和50173001)资助

X-ray Reflectivity Studies on Metal Nanoparticle/Polyelectrolyte Multilayers

LI Xiu-Hong1, TAN Zhi-Min2, HUANG Lan2, LI Xiao-Long1, MAI Zhen-Hong1, LI Ming1   

  1. 1. Institute of Physics, Chinese Academy of Sciences, Beijing 100080, China;
    2. College of Chemistry and Molecular Engineering, Peking University, Beijing 100871, China
  • Received:2003-06-17 Online:2004-07-24 Published:2004-07-24

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被引次数

13

摘要： 用静电自组装技术制备了不同层数的Au纳米颗粒-聚电解质多层膜,用X射线反射及原子力显微镜对膜的微结构进行了表征.研究发现,当Au纳米颗粒下面的聚电解质层较薄时,膜中无清晰的界面结构;随着Au纳米颗粒下面的聚电解质层的增厚,金属-聚电解质多层膜的界面变得越来越清晰.

关键词: 静电自组装, 聚电解质, 多层膜, 界面, X射线反射率

Abstract: Electrostatic self-assembly technique was used to prepare Au-nanoparticle/polyelectrolyte multilayers. The microstructures of the films were characterized by X-ray reflectivity and the atomic force microscopy. It is found that when the polyelectrolyte layers under the Au nanoparticles were thin, there were no clear interfaces in the films; when the polyelectrolyte layers got thick, the interfaces become clear. Therefore, it needs to increase properly the thickness of the polyelectrolyte layers in order to get the metal nanoparticle/polyelectrolyte multilayers with clear interfaces.

Key words: Electrostatic self-assembly, Polyelectrolyte, Multilayer films, Interfaces, X-ray reflectivity

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