[1] Wilson S.T.,Lok B.M.,Messina C.A.et al..J.Am.Chem.Soc.[J],1982,104:1146_1147
[2] Yu J.H.,Xu R.R..Acc.Chem.Res.[J],2003,36:481_490
[3] Feng P.,Bu X.,Stucky G.D..Nature[J],1997,388:735_741
[4] Bu X.,Feng P.,Stucky G.D..Science[J],1997,278:2080_2085
[5] Shi L.,Li J.Y.,Yu J.H.etal..Inorg.Chem.[J],2003,43:2703_2707
[6] Hartmann M.,Kevan L..Chem.Rev.[J],1999,99:635—664
[7] Wu J.Y.,Chien S.H.,Wan B.Z..Ind.Eng.Chem.Res.[J],2001,40:94_100
[8] Xu Y.H.,Zhang B.G.,Chen X.F.etal..J.Solid State Chem.[J],1999,145:220_226
[9] Beitone L.,Huguenard C.,Gansmller A.etal..J.Am.Chem.Soc.[J],2003,125:9102_9110
[10] Beitone L.,Loiseau T.,Millange F.etal..Chem.Mater.[J],2003,15:4590_4597
[11] SMAR Tand SAINT Software Packages[CP];Siemens Analytical X-ray Instruments,Inc.:Madison,WI,1996
[12] Sheldrick G.M..SHELXL Program,Version 5.1[CP];Siemens Industrial Automation,Inc,:Madison,WI,1997
[13] Brese N.E.,O′Keefe M..Acta Crystallogr.[J],1991,B47:192_197 |