高等学校化学学报 ›› 2022, Vol. 43 ›› Issue (6): 20220113.doi: 10.7503/cjcu20220113

• 物理化学 • 上一篇    下一篇

基于多层二硒化钨的高性能场效应晶体管的实验优化和理论模拟

张义超1, 赵付来1(), 王宇1, 王亚玲1, 沈永涛1,2, 冯奕钰1,2, 封伟1,2()   

  1. 1.天津大学材料科学与工程学院, 天津 300354
    2.天津大学先进陶瓷与加工技术教育部重点实验室, 天津 300072
  • 收稿日期:2022-02-25 出版日期:2022-06-10 发布日期:2022-04-10
  • 通讯作者: 赵付来,封伟 E-mail:ialufhz@163.com;weifeng@tju.edu.cn
  • 基金资助:
    国家自然科学基金(52103093);中国博士后科学基金(2021M702424)

Experimental Optimization and Theoretical Simulation of High Performance Field-effect Transistors Based on Multilayer Tungsten Diselenide

ZHANG Yichao1, ZHAO Fulai1(), WANG Yu1, WANG Yaling1, SHEN Yongtao1,2, FENG Yiyu1,2, FENG Wei1,2()   

  1. 1.School of Materials Science and Engineering,Tianjin University,Tianjin 300354,China
    2.Key Laboratory of Advanced Ceramics and Processing Technology,Ministry of Education,Tianjin University,Tianjin 300072,China
  • Received:2022-02-25 Online:2022-06-10 Published:2022-04-10
  • Contact: ZHAO Fulai,FENG Wei E-mail:ialufhz@163.com;weifeng@tju.edu.cn
  • Supported by:
    the National Natural Science Foundation of China(52103093);the China Postdoctoral Science Foundation(2021M702424)

摘要:

采用微机械剥离法制备了基于不同厚度的高质量WSe2纳米片的场效应晶体管(WSe2-FETs), 研究了其性能的影响因素. 通过调控WSe2纳米片及介电层的厚度、 测试温度及退火处理等, 结合理论模拟分析, 获得了WSe2-FETs的最佳电学性能. 最终, 基于7层WSe2纳米片的场效应晶体管表现出最优异的电学性能, 室温下载流子迁移率可达93.17 cm2·V?1·s?1; 在78 K低温下, 载流子迁移率高达482.78 cm2·V?1·s?1.

关键词: 微机械剥离法, 二维材料, 二维过渡金属硫族化合物, 载流子迁移率, 开关比

Abstract:

The field-effect transistors(FETs) were prepared based on high-quality WSe2 nanosheets of different thicknesses by mechanical exfoliation method and the influencing factors of their performance were investigated. By regulating the WSe2 nanosheet and dielectric layer substrate thickness, testing temperature, annealing treatment, combined with theoretical simulation analysis, the best electrical performance of WSe2-FETs was obtained. Finally, the obtained 7-layer WSe2 nanosheets exhibit the most excellent electrical properties with carrier mobility up to 93.17 cm2·V?1·s?1 at room temperature and 482.78 cm2·V?1·s?1 at low temperature of 78 K.

Key words: Mechanical exfoliation method, Two-dimensional material, Two-dimensional transition metal dichalcogenide, Carrier mobility, On/off ratio

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