高等学校化学学报 ›› 2005, Vol. 26 ›› Issue (1): 142.

• 研究论文 • 上一篇    下一篇

溴碘化银T-颗粒乳剂晶体的表面形貌研究

曹立志, 梁笑丛, 焦家俊, 庄思永   

  1. 华东理工大学精细化工研究所, 上海 200237
  • 收稿日期:2003-10-27 出版日期:2005-01-10 发布日期:2005-01-10
  • 通讯作者: 庄思永(1940年出生),男,教授,博士生导师,主要从事感光化学研究.E-mail:syzhuang@hotmail.com E-mail:syzhuang@hotmail.com
  • 基金资助:

    国家自然科学基金(批准号:20073013)资助

Morphology of the Silver Iodobromide T-grain Crystal Surface

CAO Li-Zhi, LIANG Xiao-Cong, JIAO Jia-Jun, ZHUANG Si-Yong   

  1. Institute of Fine Chemicals, East China University of Science and Technology, Shanghai 200237, China
  • Received:2003-10-27 Online:2005-01-10 Published:2005-01-10

摘要: 用原子力显微镜研究了T-颗粒卤化银晶体、掺杂有浅电子陷阱掺杂剂K4[Ru(CN)6]的掺杂乳剂晶体、经硫加金化学增感后的掺杂乳剂晶体的表面形貌以及曝光后表面形貌的变化.观察结果表明,T-颗粒晶体表面存在很多突起,经曝光后这些突起高度增加,更集中.掺入浅电子陷阱掺杂剂K4[Ru(CN)6]后,T-颗粒晶体对光更敏感,曝光后表面突起高度的增加幅度大于未掺杂乳剂光照后表面高度的变化.同时硫增感剂对表面突起的分布也有很大的影响.

关键词: 原子力显微镜, T-颗粒晶体, 表面形貌, 浅电子陷阱掺杂剂

Abstract: The morphologies of the silver iodobromide T-grain crystal surface, the doped emulsion crystal surface with the dopant K4[Ru(CN) 6] and the sulfur plus gold sensitized doped emulsion crystal surface were observed. The effects of the light exposure on above crystal surfaces were also studied with AFM. The results show that while the grain surfaces appear to be flat when observed with a common electron microscope or an atomic force microscope with a low resolution power, many hills were revealed on the crystal surface with a high resolution power. After exposure the in situ observation showed that both the heights and sizes of the hills increased. The dopant might affect the amount of the hills. After sulfur plus gold sensitization, the arrangement of the hills turned more regular.

Key words: AFM, T-grain crystal, Surface morphology, Shallow electron trapping dopant

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