高等学校化学学报 ›› 2001, Vol. 22 ›› Issue (11): 1940.

• 研究简报 • 上一篇    下一篇

原子力显微镜与透射电镜对比研究嵌段共聚物微相分离形态

王铀1,2, 李英顺2, 宋锐2, 沈静姝2, 龙程奋2   

  1. 1. 哈尔滨工业大学应用化学系, 哈尔滨 150001;
    2. 中国科学院化学研究所, 北京 100080
  • 收稿日期:2000-09-21 出版日期:2001-11-24 发布日期:2001-11-24
  • 通讯作者: 沈静姝(1941年出生),女,研究员,主要从事高分子结构与性能研究.
  • 基金资助:

    国家基础研究重大关键项目“高分子凝聚态基本物理问题研究”及高分子物理实验室基金资助

A Comparative Study on Morphology of Block Copolymer Using Atomic Force Microscopy and Transmission Electronics Microscopy

WANG You1,2, LI Ying-Shun2, SONG Rui2, SHEN Jing-Shu2, LONG Cheng-Fen2   

  1. 1. Applied Chemistry Department, Harbin Institute of Technology, Harbin 150001, China;
    2. Polymer Physics Laboratory, Instituteof Chemistry, The Chinese Academy of Sciences, Beijing 100080, China
  • Received:2000-09-21 Online:2001-11-24 Published:2001-11-24

关键词: 原子力显微镜, 透射电镜, 微观相分离, 形态

Abstract: The morphology of poly(styrene ethylene/butylene styrene)(SEBS) triblock copolymer cast from heptane and toluene was studied by combining atomic force microscopy(AFM) with transmission electronics microscopy(TEM). The quantitative agreement of the results of AFMand TEMplays a key role in-determining the phase attribution for the AFMimages. It is confirmed that under the moderate tapping condition, the hills in AFMheight images correspond to the polystyrene phase and the valleys to the rubbery phase.

Key words: AFM, TEM, Microphase separation, Morphology

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