高等学校化学学报 ›› 2024, Vol. 45 ›› Issue (8): 20240146.doi: 10.7503/cjcu20240146

• 物理化学 • 上一篇    下一篇

协同添加剂对电子电镀铜成核及镀层形貌与结构的影响机制

金磊1(), 王赵云2, 杨防祖3, 詹东平3   

  1. 1.重庆市超常配位键工程与新材料技术实验室, 长江师范学院材料科学与工程学院, 重庆 408100
    2.厦门大学电子科学与技术学院, 3. 固体表面物理化学国家重点实验室, 化学化工学院, 厦门 361005
  • 收稿日期:2024-03-27 出版日期:2024-08-10 发布日期:2024-07-03
  • 通讯作者: 金磊 E-mail:leijin@yznu.edu.cn
  • 基金资助:
    国家自然科学基金(22132003);长江师范学院科研项目(010730153)

Influence Mechanism of Synergistic Additives on the Nucleation and Coating Morphology and Structure of Copper Electronic Plating

JIN Lei1(), WANG Zhaoyun2, YANG Fangzu3, ZHAN Dongping3   

  1. 1.Chongqing Key Laboratory of Extraordinary Bond Engineering and Advance Materials Technology(EBEAM),School of Materials Science and Engineering,Yangtze Normal University,Chongqing 408100,China
    2.School of Electronic Science and Engineering
    3.State Key Laboratory of Physical Chemistry of Solid Surfaces,College of Chemistry and Chemical Engineering,Xiamen University,Xiamen 361005,China
  • Received:2024-03-27 Online:2024-08-10 Published:2024-07-03
  • Contact: JIN Lei E-mail:leijin@yznu.edu.cn
  • Supported by:
    the National Natural Science Foundation of China(22132003);the Research Funding Project of Yangtze Normal University, China(010730153)

摘要:

基于以1-(2-吡啶偶氮)-2-萘酚(PAN)为协同添加剂、 用于印制电路板(PCB)通孔均匀增厚的酸性硫酸铜电子电镀配方及工艺, 通过电化学计时电流法阐明了单一添加剂及各添加剂间协同作用对铜电结晶过程的影响机制. 聚乙二醇(PEG)破坏铜成核过程, 聚二硫丙烷磺酸钠(SPS)与PAN不影响铜成核行为的发生, PEG, SPS和PAN共同作用可进一步促进铜晶核的形成. 通过电化学原位拉曼光谱从分子层面证实了添加剂PEG和SPS均可促进PAN在铜电极表面吸附. 通过扫描电子显微镜分析了添加剂对铜镀层形貌的影响, 只有SPS可细化铜镀层颗粒, PEG, SPS和PAN协同作用有利于获得颗粒更加细小且均匀的铜镀层. 通过X射线衍射分析揭示了铜镀层晶面取向及添加剂吸附的晶面位点, PEG和PAN均易吸附于(111)晶面, 抑制(220)晶面择优; 而SPS易吸附于(220)晶面, 促进(220)晶面择优. PEG和SPS共同作用可使铜沿着(111), (200)和(220)晶面生长, (200)为相对的择优晶面. 3种添加剂间复杂的协同作用促使铜进一步沿(111)和(200)晶面择优生长.

关键词: 电子电镀铜, 添加剂, 成核, 形貌, 择优取向, 协同作用

Abstract:

In this work, based on the acidic copper sulfate electronic plating formula and process for through-hole uniform thickening of printed circuit board(PCB) with 1-(2-pyridylazo)-2-naphthol(PAN) as a synergistic additive, the influence mechanism of the additives on the copper electro-crystallization process was clarified by using the electrochemical chronoamperometry. Polyethylene glycol(PEG) destroys the copper nucleation process, bis-(3-sulfopropyl)disulfide(SPS) and PAN do not affect the occurrence of copper nucleation behavior, and the synergic effects of PEG, SPS and PAN can further promote the formation of copper nuclei. Both PEG and SPS promote the adsorption of PAN on the copper surface confirmed through electrochemical in situ Raman spectroscopy. The effects of additives on the morphology of copper coating are analyzed by scanning electron microscopy. Only SPS can refine the copper coating particles, and the synergistic effects of PEG, SPS and PAN is beneficial to obtain copper coating with finer and more uniform particles. The crystal face orientation of copper coating and the crystal face sites adsorbed by additives are revealed by X-ray diffraction. Both PEG and PAN are easy to adsorb on the (111) crystal face and inhibit the (220) crystal face. SPS is easy to adsorb on the (220) crystal face and promotes the (220) crystal face to be preferred. The combined action of PEG and SPS can make copper grow along the (111), (200) and (220) crystal faces, and (200) is a relatively preferred crystal face. The complex synergistic effects among the three additives promote the preferential growth of copper along the (111) and (200) crystal faces.

Key words: Copper electronic plating, Additives, Nucleation, Morphology, Preferential orientation, Synergistic effect

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