Chem. J. Chinese Universities ›› 2010, Vol. 31 ›› Issue (11): 2113.

• Letter • Previous Articles     Next Articles

Elemental Imaging of Mineral Surface by Laser Ionization Time-of-Flight Mass Spectrometry

HUANG Rong-Fu1, ZOU Dong-Xuan2, ZHANG Bo-Chao2, GONG Zhen-Bin1*, HANG Wei1,2*, HE Jian3, HUANG Ben-Li2   

  1. 1. State Key Laboratory of Marine Environmental Science, College of Oceanography and Environmental Science;
    2. Department of Chemistry, College of Chemistry and Chemical Engineering, Key Laboratory of Analytical Sciences;
    3. Department of Mechanical & Electrical Engineering, College of Physics and Mechanical & Electrical Engineering, Xiamen University, Xiamen 361005, China
  • Received:2010-07-02 Online:2010-11-10 Published:2010-11-10
  • Contact: GONG Zhen-Bin. E-mail: zbgong@xmu.edu.cn; HANG Wei. E-mail: weihang@xmu.edu.cn
  • Supported by:

    厦门大学海洋环境学院博士后启动经费资助.

Abstract: An elemental imaging system was developed based on the high irradiance laser ionization time-of-flight mass spectrometry(LI-TOF-MS), which could be applied to analyze all elements simultaneously and sensitively, including metals and non-metals. A stibnite sample was analyzed and elemental images of Sb, S, Si, Al, K, Ca, and Fe were subsequently acquired. Standardless semi-quantitation of detected elements on the stibnite surface was thus performed and the results indicate that the surface elemental imaging system associated with the LI-TOF-MS was a promising tool for elemental imaging of solid surface and standardless elemental semi-quantitation.

Key words: Laser ionization, Time-of-flight mass spectrometry, Elemental imaging, Mineral

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