高等学校化学学报 ›› 1991, Vol. 12 ›› Issue (2): 265.

• 论文 • 上一篇    下一篇

激光等离子体诱发SiCl4解离沉积硅膜的研究

张杰1, 张昌言1, 蔺恩惠1, 李艳玲1, 邱明新2, 陆雪标2   

  1. 1. 西北师范大学化学所, 730070;
    2. 上海市激光技术研究所
  • 收稿日期:1989-07-07 出版日期:1991-02-24 发布日期:1991-02-24
  • 通讯作者: 张昌言
  • 基金资助:

    北京中关村联合测试基金

Studies on Deposition of Silicon Film by Laser-Plasma-Induced Dissociation of SiCl4

Zhang Jie1, Zhang Chang-yan1, Lin En-hui1, Li Yan-ling1, Qiu Ming-xin2, Lu Xue-biao2   

  1. 1. Institute of Chemistry, Northwest Normal University, Lanzhou, 730070;
    2. Shanghai Institute of Laser Technology, Shanghai
  • Received:1989-07-07 Online:1991-02-24 Published:1991-02-24

摘要: 硅是重要半导体材料之一,其薄膜广泛应用于集成电路和太阳能电池。但用普通方法制备纯硅需要很高温度,而利用激光便可在低温下进行。因此激光诱导化学气相沉积技术是改革集成电路工艺和制备太阳能电池的一种很有希望的方法。本文用SiCl4代替通常使用的SiH4,用TEACO2激光诱导SiCl4解离气相沉积硅膜。

关键词: 激光化学气相沉积(LCVD), 等离子体, 四氯化硅, 硅膜

Abstract: Silicon film was first deposited on a quartz substrate by laser-plasma-induced dissociation of SiCl4. The characteristics of the film obtained is compared with that from laser deposition of SiH4in some references.

Key words: Laser chemical vapor deposition (LCVD), Plasma, Silicon tetrachloride, Silicon film

TrendMD: