高等学校化学学报 ›› 2003, Vol. 24 ›› Issue (10): 1750.

• 研究简报 • 上一篇    下一篇

声表面波器件用〈110〉取向ZnO薄膜的MOCVD生长

赵佰军, 杜国同, 王金忠, 杨洪军, 张源涛, 杨小天, 马艳, 刘博阳, 杨天鹏, 刘大力   

  1. 吉林大学电子科学与工程学院, 长春 130023
  • 收稿日期:2002-11-26 出版日期:2003-10-24 发布日期:2003-10-24
  • 通讯作者: 杜国同(1945年出生),男,教授,博士生导师,主要从事半导体材料生长和半导体光电器件研究.E-mail:laserlab@mail.jlu.edu.cn E-mail:laserlab@mail.jlu.edu.cn
  • 基金资助:

    国家自然科学基金(批准号:60177007和60176026);863项目(批准号:2001AA311130)资助

Growth of <110> Oriented ZnO Films Used for SAWF by MOCVD

ZHAO Bai-Jun, DU Guo-Tong, WANG Jin-Zhong, YANG Hong-Jun, ZHANG Yuan-Tao, YANG Xiao-Tian, MA Yan, LIU Bo-Yang, YANG Tian-Peng, LIU Da-Li   

  1. College of Electronics and Engineering, Jilin University, Changchun 130023, Chin
  • Received:2002-11-26 Online:2003-10-24 Published:2003-10-24

关键词: 蓝宝石, 声表面波器件(SAWF), ZnO, XRD, AFM, PL

Abstract: ZnO films with <110> orientation were grown on R-Al2O3substrates by LP-MOCVD, and the growth temperature was optimized.The quality of crystal, surface morphology and optical characteristic of the samples were investigated by XRD, AFM and PLmethod.The experimental results show that the FWHM of the optimized sample is only 0.50°. Compared with that of the sample grown on C-Al2O3materiaLUnder the same conditions, the surface morphology of the first sample is denser and smooth, while the PLspectra indicate that the exciton emitting intensity of <110> oriented ZnO film in the ultraviolet range is lower.However, the deep-level emission related to the intrinsic defects disappears in the spectrum.All above indicate that the <110> oriented ZnO film is more suitable for fabrication of the film SAWF with a low loss and a high frequency than for fabrication of the emitting device in ultraviolet range.

Key words: Sapphire, SAWF, ZnO, XRD, AFM, PL

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