Chem. J. Chinese Universities ›› 2005, Vol. 26 ›› Issue (4): 751.

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Electricity Characterization of Metalloprotein at Molecular Level by Conducting Atomic Force Microscopy

ZHAO Jian-Wei1, WANG Nan2   

  1. 1. Department of Chemistry, Nanjing University, Nanjing 210093, China;
    2. Department of Chemistry and Chemical Engineering, Chongqing University, Chongqing 400044, China
  • Received:2004-04-20 Online:2005-04-10 Published:2005-04-10

Abstract: The electric and dielectric properties of metalloprotein, azurin, were studied at real molecular level by using conducting atomic force microscopy(C-AFM). Under a force lower than 2 nN, dielectric breakdown was observed. When reliable electrical contact between electrodes and protein is achieved under a force greater than 5 nN, well-behaved current-voltage characters are revealed, and dependent on the force load.

Key words: Conducting atomic force microscopy, Protein, Dielectric strength

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