Chem. J. Chinese Universities ›› 2002, Vol. 23 ›› Issue (1): 46.

• Articles • Previous Articles     Next Articles

The AFM Characterization of Ni(phen)3(2+)Fixing Effects on DNA

YU Li-Hua1, LI Zhuang1, WU Ai-Guo1, WANG Hong-Da1, SUO Quan-Ling2, BI Xiao-Hui3, HUANG Bai-Qu3   

  1. 1. Laboratory of Eletroanalytical Chemistry, Changchun Institute of Applied Chemistry, Chinese Academy of Sciences, Changchun 130022, China;
    2. Department of Chemistry, Chemical Engineering Institute, Inner Mongolia Technological University, Hohhot 010064, China;
    3. Institute of Cytology and Genetics, Northeast Normal University, Changchun 130024, China
  • Received:2000-09-11 Online:2002-01-24 Published:2002-01-24

Abstract: In this paper, the fixing and stretching effect of Ni(phen) 2+ 3 with different concentrations on DNAhad been studied by Tapping mode AFM. Under an ambient condition, the high resolution DNAimages were obtained, the average height, width and length of well spread DNAmolecules were measured. The results showed that because of the variations of ionic concentration, the density and topography of DNAmolecules on substrate had a great difference. The AFMand gel electrophoresis results also showed that, under our experimental condition, DNAmolecules kept intact, Ni(phen) 2+ 3 did not catalyze the cleavage activity of EcoRI, therefore, Ni(phen) 2+ 3 would be used to make high resolution physical mapping of DNAby AFM.

Key words: Atomic Force Microscope(AFM), DNA, Ni(phen) 2+ 3, Gel electrophoresis

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