关键词: 慢扫速示波计时电位法, 切口, 灵敏度

Abstract: Slow sweep oscillographic chronopotentiometry has been developed as a new oscillographic analytical method.Usually, in studying classical oscillographic chronopotentiometry, frequency of alternating current must be over 10 Hz, so only with oscillograph, can we see oscillogram and it is very difficult for applying classical oscillographic chronopotentiometry to determine trace materials.In order to solve these problems, a new methodcalled slow sweep oscillographic chronopotentiometry is presented.In the field of low frequency, dE/dt-Ecurve can also be observed with oscillograph or X-Yrecorder.In usingthis method, since charging current is decreased, sensitivity can be increased greatly.Minimum detectable amount of materials is down to 10^-9mol/L, This method is very useful in actual analytical measurement as well as theoretical studies.In experiment, we observe thatincision of anodic branch is sharper than that of cathodic branch.By using this way, we determined a series of ions such as Tl⁺, Pb²⁺, In³⁺, Cd²⁺, S^2-.Minimum detectable amount isrespectively 5×10^-9, 4.5×10^-7, 3×10^-8, 1×10^-7, 1.8×10^-5mol/L.

Key words: Slow sweep oscillographic chronopotentiometry, Incision, Sensitivity