Chem. J. Chinese Universities ›› 2004, Vol. 25 ›› Issue (7): 1314.

• Articles • Previous Articles     Next Articles

X-ray Reflectivity Studies on Metal Nanoparticle/Polyelectrolyte Multilayers

LI Xiu-Hong1, TAN Zhi-Min2, HUANG Lan2, LI Xiao-Long1, MAI Zhen-Hong1, LI Ming1   

  1. 1. Institute of Physics, Chinese Academy of Sciences, Beijing 100080, China;
    2. College of Chemistry and Molecular Engineering, Peking University, Beijing 100871, China
  • Received:2003-06-17 Online:2004-07-24 Published:2004-07-24

Abstract: Electrostatic self-assembly technique was used to prepare Au-nanoparticle/polyelectrolyte multilayers. The microstructures of the films were characterized by X-ray reflectivity and the atomic force microscopy. It is found that when the polyelectrolyte layers under the Au nanoparticles were thin, there were no clear interfaces in the films; when the polyelectrolyte layers got thick, the interfaces become clear. Therefore, it needs to increase properly the thickness of the polyelectrolyte layers in order to get the metal nanoparticle/polyelectrolyte multilayers with clear interfaces.

Key words: Electrostatic self-assembly, Polyelectrolyte, Multilayer films, Interfaces, X-ray reflectivity

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