高等学校化学学报 ›› 1999, Vol. 20 ›› Issue (S1): 57-57.

• Atomic Spectrometry • 上一篇    下一篇

Direct Determination of Trace Impurities in Silicon Nitride by Fluorinating ETV-ICP-AES with the Slurry Sampling Technique

PENG Tian-You, JIANG Zu-Cheng, HU Bin, LIAO Zheng-Huan   

  1. Department of Chemistry, Wuhan University, Wuhan 430072, P. R. China
  • 出版日期:1999-12-31 发布日期:1999-12-31

Direct Determination of Trace Impurities in Silicon Nitride by Fluorinating ETV-ICP-AES with the Slurry Sampling Technique

PENG Tian-You, JIANG Zu-Cheng, HU Bin, LIAO Zheng-Huan   

  1. Department of Chemistry, Wuhan University, Wuhan 430072, P. R. China
  • Online:1999-12-31 Published:1999-12-31

摘要:

Silicon nitride (Si3N4) ceramics are of great technological importance as high-density. corrosion-and heat-resistant materials for use in high-temperature and in reactor technology.

Abstract:

Silicon nitride (Si3N4) ceramics are of great technological importance as high-density. corrosion-and heat-resistant materials for use in high-temperature and in reactor technology.