高等学校化学学报
Direct Determination of Trace Impurities in Silicon Nitride by Fluorinating ETV-ICP-AES with the Slurry Sampling Technique
PENG Tian-You, JIANG Zu-Cheng, HU Bin, LIAO Zheng-Huan
Direct Determination of Trace Impurities in Silicon Nitride by Fluorinating ETV-ICP-AES with the Slurry Sampling Technique
PENG Tian-You, JIANG Zu-Cheng, HU Bin, LIAO Zheng-Huan
高等学校化学学报 . 1999, (S1): 57 -57 .