%0 Journal Article %A PENG Tian-You %A JIANG Zu-Cheng %A HU Bin %A LIAO Zheng-Huan %T Direct Determination of Trace Impurities in Silicon Nitride by Fluorinating ETV-ICP-AES with the Slurry Sampling Technique %D 1999 %R %J 高等学校化学学报 %P 57-57 %V 20 %N S1 %X

Silicon nitride (Si3N4) ceramics are of great technological importance as high-density. corrosion-and heat-resistant materials for use in high-temperature and in reactor technology.

%U http://www.cjcu.jlu.edu.cn/CN/abstract/article_16101.shtml