Chem. J. Chinese Universities ›› 2001, Vol. 22 ›› Issue (11): 1940.

• Articles • Previous Articles     Next Articles

A Comparative Study on Morphology of Block Copolymer Using Atomic Force Microscopy and Transmission Electronics Microscopy

WANG You1,2, LI Ying-Shun2, SONG Rui2, SHEN Jing-Shu2, LONG Cheng-Fen2   

  1. 1. Applied Chemistry Department, Harbin Institute of Technology, Harbin 150001, China;
    2. Polymer Physics Laboratory, Instituteof Chemistry, The Chinese Academy of Sciences, Beijing 100080, China
  • Received:2000-09-21 Online:2001-11-24 Published:2001-11-24

Abstract: The morphology of poly(styrene ethylene/butylene styrene)(SEBS) triblock copolymer cast from heptane and toluene was studied by combining atomic force microscopy(AFM) with transmission electronics microscopy(TEM). The quantitative agreement of the results of AFMand TEMplays a key role in-determining the phase attribution for the AFMimages. It is confirmed that under the moderate tapping condition, the hills in AFMheight images correspond to the polystyrene phase and the valleys to the rubbery phase.

Key words: AFM, TEM, Microphase separation, Morphology

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