Chem. J. Chinese Universities ›› 2019, Vol. 40 ›› Issue (1): 187.doi: 10.7503/cjcu20180342
• Polymer Chemistry • Previous Articles Next Articles
LIU Yi1,2, XU Xiaozhou1,2, MO Song1, ZHAI Lei1, HE Minhui1, FAN Lin1,2,*()
Received:
2018-05-03
Online:
2019-01-10
Published:
2018-09-22
Contact:
FAN Lin
E-mail:fanlin@iccas.ac.cn
CLC Number:
TrendMD:
LIU Yi, XU Xiaozhou, MO Song, ZHAI Lei, HE Minhui, FAN Lin. Thermal Stability of Polyimide Resins Containing Siloxane Structure and Their High Temperature Structural Evolution[J]. Chem. J. Chinese Universities, 2019, 40(1): 187.
Sample | n(TFDB):n(APDS) | Mass fraction of siloxane(%) | n | Mn(Theoretical) |
---|---|---|---|---|
PEPA-PIS-0 | 10:0 | 0 | 1.23 | 1500 |
PEPA-PIS-1 | 9:1 | 1.29 | 1.25 | 1500 |
PEPA-PIS-2 | 8:2 | 2.59 | 1.26 | 1500 |
PEPA-PIS-3 | 7:3 | 3.92 | 1.28 | 1500 |
PA-PIS-1 | 9:1 | 1.47 | 1.60 | 1500 |
PA-PIS-10 | 0:10 | 15.81 | 1.76 | 1500 |
Table 1 Chemical composition of PEPA-terminated and PA-terminated oligoimides
Sample | n(TFDB):n(APDS) | Mass fraction of siloxane(%) | n | Mn(Theoretical) |
---|---|---|---|---|
PEPA-PIS-0 | 10:0 | 0 | 1.23 | 1500 |
PEPA-PIS-1 | 9:1 | 1.29 | 1.25 | 1500 |
PEPA-PIS-2 | 8:2 | 2.59 | 1.26 | 1500 |
PEPA-PIS-3 | 7:3 | 3.92 | 1.28 | 1500 |
PA-PIS-1 | 9:1 | 1.47 | 1.60 | 1500 |
PA-PIS-10 | 0:10 | 15.81 | 1.76 | 1500 |
Structure | 370 ℃ | 420 ℃ | 450 ℃ | |||||||
---|---|---|---|---|---|---|---|---|---|---|
Eb/eV | Molar fraction of Si(%) | Eb/eV | Molar fraction of Si(%) | Eb/eV | Molar fraction of Si(%) | |||||
D[(CH3)2SiO2/2] | | 102.01 | 90.19 | 102.06 | 14.76 | 101.96 | 6.90 | |||
T[CH3SiO3/2] | | 102.97 | 9.81 | 102.90 | 48.34 | 102.93 | 23.61 | |||
Q[SiO4/2] | | —— | —— | 103.53 | 36.90 | 103.51 | 69.49 |
Table 2 Curve fitting results of Si2p XPS spectra for cured and postcured PEPA-PIS-1
Structure | 370 ℃ | 420 ℃ | 450 ℃ | |||||||
---|---|---|---|---|---|---|---|---|---|---|
Eb/eV | Molar fraction of Si(%) | Eb/eV | Molar fraction of Si(%) | Eb/eV | Molar fraction of Si(%) | |||||
D[(CH3)2SiO2/2] | | 102.01 | 90.19 | 102.06 | 14.76 | 101.96 | 6.90 | |||
T[CH3SiO3/2] | | 102.97 | 9.81 | 102.90 | 48.34 | 102.93 | 23.61 | |||
Q[SiO4/2] | | —— | —— | 103.53 | 36.90 | 103.51 | 69.49 |
Fig.7 Si2p XPS spectra measured for different depths of PEPA-PIS-1 after post-curing at 450 ℃Depth/mm: (A) 0.02; (B) 0.10; (C) 0.15; (D) 0.20; (E) 0.40; (F) 0.80.
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