高等学校化学学报 ›› 1999, Vol. 20 ›› Issue (S1): 473.

• Mass Spectrometry • 上一篇    下一篇

The Simulation of Reflectron Time-of-Flight Mass Spectrometer

HE Jian, ZHEN Zhou, WANG Xiao-Ru, YANG Peng-Yuan   

  1. Department of Chemistry and the Key Laboratory of Analytical Sciences of MOE, Xiamen University, Xiamen 361005, P. R. China
  • 出版日期:1999-12-31 发布日期:1999-12-31
  • 基金资助:

    Supported by the key project of National Natural Science Foundation of China and the Analytical Test Instrument Development Foundation of China.

The Simulation of Reflectron Time-of-Flight Mass Spectrometer

HE Jian, ZHEN Zhou, WANG Xiao-Ru, YANG Peng-Yuan   

  1. Department of Chemistry and the Key Laboratory of Analytical Sciences of MOE, Xiamen University, Xiamen 361005, P. R. China
  • Online:1999-12-31 Published:1999-12-31
  • Supported by:

    Supported by the key project of National Natural Science Foundation of China and the Analytical Test Instrument Development Foundation of China.

摘要:

Owing to its wide mass range, high sensitivity, fast spectrum registration, and high resolution,the reflectron time-of-flight mass spectrometer is applied to more and more places. The Simulation of the reflectron TOF-MS is vitally necessary and helpful. The software MAPLE and SIMION are employed in our works.

Abstract:

Owing to its wide mass range, high sensitivity, fast spectrum registration, and high resolution,the reflectron time-of-flight mass spectrometer is applied to more and more places. The Simulation of the reflectron TOF-MS is vitally necessary and helpful. The software MAPLE and SIMION are employed in our works.

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