高等学校化学学报

高等学校化学学报 ›› 1999, Vol. 20 ›› Issue (S1): 39.

• Atomic Spectrometry • 上一篇    下一篇

Research and Applications of Total Reflection X-ray Fluorescence Analyzer

WU Xu-Ran, ZENG Su-Hua, LIU Kai, WANG Jing-Yun, TIAN Yu-Hong   

  1. Yantai University, Yantai, 264005, P. R. China
  • 出版日期:1999-12-31 发布日期:1999-12-31

Research and Applications of Total Reflection X-ray Fluorescence Analyzer

WU Xu-Ran, ZENG Su-Hua, LIU Kai, WANG Jing-Yun, TIAN Yu-Hong   

  1. Yantai University, Yantai, 264005, P. R. China
  • Online:1999-12-31 Published:1999-12-31

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摘要：

Total reflection x-ray fluorescence (TXRF) is a fairly new element analysis method. The TXRF, due to using of total reflection, reduces greatly detection limits and thus places in a leading position in area of atomic spectroscopy. Comparing with AAS, ICP-OES,ICP-MS, NAA, SRXRF and PIXE, TXRF offers superiority combined in low detection limit, small sample mass,multielement simultaneous and non-destructive analysis,greater convenience and low cost.

Abstract:

Total reflection x-ray fluorescence (TXRF) is a fairly new element analysis method. The TXRF, due to using of total reflection, reduces greatly detection limits and thus places in a leading position in area of atomic spectroscopy. Comparing with AAS, ICP-OES,ICP-MS, NAA, SRXRF and PIXE, TXRF offers superiority combined in low detection limit, small sample mass,multielement simultaneous and non-destructive analysis,greater convenience and low cost.

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