高等学校化学学报 ›› 1995, Vol. 16 ›› Issue (S1): 71.
Jiang L.1,2, Iyoda T.2, Hashimoto K.1,2, Fujishima1,2
Jiang L.1,2, Iyoda T.2, Hashimoto K.1,2, Fujishima1,2
摘要:
The atomic force microscope (AFM) was used to manipulate surface structures of conjugated carbon materials (graphite and C70) in the nanometer scale with real space resolution. Soliton superlattice was directly observed on both graphite and C70 single crystals surface. The tip-induced dynamic structural changes were also investigated. 丁he manipulations of both sp3-like line defects on the lattice of graphite and individual C70 molecules on defect-free surface or at molecular layer edges were suggested.
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