高等学校化学学报 ›› 1995, Vol. 16 ›› Issue (S1): 112.

• 研究论文 • 上一篇    下一篇

Observation of Organic Thin Film Surface by Atomic Force Microscopy

WANG Guang-ming1,2, DING De-sheng1,2, LU Zu-hong1,2, WEI Yu1,2, DING Ying3   

  1. 1. National Laboratory of Molecular and Bioelectronics, Southeast University, Nanjing, 210096, P. R. China;
    2. Center for Advanced Studies in Science and Technology of Microstructures, Nanjing, 210093, P. R. China;
    3. Department of Electronic Engineering, Southeast University, Nanjing, 210096, P. R. China
  • 收稿日期:1995-08-25 出版日期:1995-12-31 发布日期:1995-12-31
  • 基金资助:

    National Natural Science Foundation of China

Observation of Organic Thin Film Surface by Atomic Force Microscopy

WANG Guang-ming1,2, DING De-sheng1,2, LU Zu-hong1,2, WEI Yu1,2, DING Ying3   

  1. 1. National Laboratory of Molecular and Bioelectronics, Southeast University, Nanjing, 210096, P. R. China;
    2. Center for Advanced Studies in Science and Technology of Microstructures, Nanjing, 210093, P. R. China;
    3. Department of Electronic Engineering, Southeast University, Nanjing, 210096, P. R. China
  • Received:1995-08-25 Online:1995-12-31 Published:1995-12-31
  • Supported by:

    National Natural Science Foundation of China

摘要:

The 8-hydroxyquinoline neodymium(Ndq3) organic thin films deposited on the cleaned indium/tin oxide (ITO) at different deposition rates with the same vacuity (133.3×10-5 Pa) were revealed by atomic force microscopy (AFM). Organic devices with one layer of Ndq3 as the e-type conductive material at different deposition rates sandwiched between ITO and aluminum electrodes have been fabricated. respectively. Evidence suggests that the current-voltage (I-V) characteristics were determined by the uniformity of organic film which was controlled by the deposition conditions.

关键词: 8-Hydroxyquinoline neodymium, Thin film, Atomic force microscopy

Abstract:

The 8-hydroxyquinoline neodymium(Ndq3) organic thin films deposited on the cleaned indium/tin oxide (ITO) at different deposition rates with the same vacuity (133.3×10-5 Pa) were revealed by atomic force microscopy (AFM). Organic devices with one layer of Ndq3 as the e-type conductive material at different deposition rates sandwiched between ITO and aluminum electrodes have been fabricated. respectively. Evidence suggests that the current-voltage (I-V) characteristics were determined by the uniformity of organic film which was controlled by the deposition conditions.

Key words: 8-Hydroxyquinoline neodymium, Thin film, Atomic force microscopy

TrendMD: