高等学校化学学报 ›› 1995, Vol. 16 ›› Issue (S1): 112.
WANG Guang-ming1,2, DING De-sheng1,2, LU Zu-hong1,2, WEI Yu1,2, DING Ying3
WANG Guang-ming1,2, DING De-sheng1,2, LU Zu-hong1,2, WEI Yu1,2, DING Ying3
摘要:
The 8-hydroxyquinoline neodymium(Ndq3) organic thin films deposited on the cleaned indium/tin oxide (ITO) at different deposition rates with the same vacuity (133.3×10-5 Pa) were revealed by atomic force microscopy (AFM). Organic devices with one layer of Ndq3 as the e-type conductive material at different deposition rates sandwiched between ITO and aluminum electrodes have been fabricated. respectively. Evidence suggests that the current-voltage (I-V) characteristics were determined by the uniformity of organic film which was controlled by the deposition conditions.
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