在非离子表面活性剂存在下结晶紫-硅钼杂多酸光度法测定痕量硅的研究

高等学校化学学报 ›› 1986, Vol. 7 ›› Issue (9): 775.

在非离子表面活性剂存在下结晶紫-硅钼杂多酸光度法测定痕量硅的研究

王镇棣¹, 郑用熙²

1. 南京林学院理化分析中心;
2. 清华大学化学化工系

收稿日期:1985-03-25 出版日期:1986-09-24 发布日期:1986-09-24

Highly Sensitive Spectrophotometric Determination of Trace Silicon as Crystal Violet-Molybdosilicate in the Presence of Nonionic Surfactant

Wang Zhendi¹, Zheng Yongxi²

1. Center of Chemical Analysis, Nanjing Institute of Forestry, Kanjing;
2. Department of Chemistry and Chemical Engineering, Tsinghua University, Beijing

Received:1985-03-25 Online:1986-09-24 Published:1986-09-24

摘要/Abstract

摘要： 本文研究了在非离子表面活性剂存在下结晶紫-硅钼杂多酸离于缔合物的分光光度性质,建立了灵敏度较高的水相测定痕量硅的分光光度法。硅量在0—3.0μg/25ml范围符合比耳定律,表观摩尔吸光系数为1.45×10⁵。还讨论了离子缔合物的结构特点。测定实际样品的结果令人满意。

Abstract: Ahighly sensitive spectrophotomctric method for determination of silicon,based on the ion-associate formed by molybdosilicatc ( SiMo ) with crystal violet (CV) in the presence of emulsifying agent OP,is described.The molar absorptivity of CV-SiMo was found to be 1.45×10⁵dm³·mol^-1·cm^-1 at 555 nm.Beer's law was obeyed in 0-3.0μgSi/25ml.The proposed method has been applied to the determination of trace amount of silicon in water samples and alloys with Satisfactory results.The solubilization effect of the micelle of the nonionic surfactant on the ion-associate is further discussed.The spectrophotometric properties of the ion-associate was shown to depend mainly upon the properties of the basic dye cations.

TrendMD:

王镇棣, 郑用熙. 在非离子表面活性剂存在下结晶紫-硅钼杂多酸光度法测定痕量硅的研究. 高等学校化学学报, 1986, 7(9): 775.

Wang Zhendi, Zheng Yongxi. Highly Sensitive Spectrophotometric Determination of Trace Silicon as Crystal Violet-Molybdosilicate in the Presence of Nonionic Surfactant. Chem. J. Chinese Universities, 1986, 7(9): 775.