高等学校化学学报

高等学校化学学报 ›› 1985, Vol. 6 ›› Issue (8): 725.

• 研究论文 • 上一篇    下一篇

硅胶表面“接枝”度光电子能谱(XPS)的测定

黄惠忠1, 郭沁林1, 桂琳琳1, 汪勤慰2, 段晓青2   

  1. 1. 北京大学物理化学研究所;
    2. 北京大学化学系
  • 收稿日期:1984-02-24 出版日期:1985-08-24 发布日期:1985-08-24

Determination of the Graft Degree on the Surface of Silica GEL by XPS

Huang Huizhong1, Guo Qinlin1, Gui Linlin1, Wang Qinwei2, Duan Xiaoqing2   

  1. 1. The Institute of Physical, Chemistry, Peking University, Beijing;
    2. Department of Chemistry, Peking University, Beijing
  • Received:1984-02-24 Online:1985-08-24 Published:1985-08-24

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摘要： 本文叙述了用XPS测定硅胶表面“接枝”度的半定量分析方法。

Abstract: Attention is being increasingly paid to the new material prepared by bonding organic molecules to the surface of silica gel in the preparation of catalyst or packing material for liquid chromatographic column.There has not been a quantitative method for determining or characterizing the graft degree on the silica gel surface yet. This paper provides a new semi-quantitative method.

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