Chem. J. Chinese Universities

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Preparation of SnO2/MCM-41 Semiconducter Sensors with MOCVD and Their Properties

LIU Xiu-Li1, GAO Guo-Hua1*, KAWI Sibudjing2   

    1. Shanghai Key Laboratory of Green Chemistry and Chemical Process, Department of Chemistry, East China Normal University, Shanghai 200062, China;
    2. Department of Chemical and Biomolecular Engineering, National University of Singapore, Singapore 119260, Singapore
  • Received:2007-01-29 Revised:1900-01-01 Online:2007-09-10 Published:2007-09-10
  • Contact: GAO Guo-Hua

Abstract: SnO2/MCM-41 semiconductor sensors were prepared by metallorganic chemical vapor deposition(MOCVD). The amount of deposition, specific surface area and pore distribution of SnO2/MCM-41 depend on the deposition time and temperatures. The fact that pore size are closely related with the amount of deposition indicates that SnO2 is coated smoothly in the pore of MCM-41. SnO2/MCM-41 sensor has high sensitivities for CO and H2. The sensitivities show a linear relation with the concentration of CO and H2.

Key words: Semiconductor sensor, MCM-41, MOCVD, Tin dioxide, Thin film

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