Tuning of Ionic Interaction and Rheological Properties of Nanoscale Ionic Materials†

doi:10.7503/cjcu20150856

Abstract

Abstract:

We prepared two kinds of silica-based nanoscale ionic materials(NIMs) with increasing SiO₂ contents, and also with different relative ionic interaction strengths between their constituents(SiO₂-SIT-M2070>SiO₂-SIT-Ethomeen for the relative ionic interaction strength). The results of transmission electron microscope(TEM) and small-angle X-ray scattering(SAXS) investigations indicated that there was no obvious nano-particle aggregate in both kinds of NIMs. The differential scanning calorimetry(DSC) results showed that the ionic interactions prohibited the crystallization of out-shell block copolymers in the prepared NIMs. Moreover, the crystallization suppression was more serious with increasing the ionic interaction strength. Ionic interaction also displayed the dramatic influence on the dynamic rheological behavior of as-prepared NIMs. The dynamic shear moduli and viscosities of SiO₂-SIT-Ethomeen were about 1—3 orders of magnitude lower than those of SiO₂-SIT-M2070 with the same solid contents. Under the shear of large dynamic strain, SiO₂-SIT-M2070 with the relatively high solid contents showed the soft glass rheological properties, while SiO₂-SIT-Ethomeen showed the phenomenon of strong strain overshoot. Furthermore, the strain that corresponding with the maximum of dynamic shear moduli and viscosities gradually decreased with the increasing of solid contents, and so did the degree of overshoot. All above results suggested that the rheological properties of NIMs could be effectively controlled by carefully tuning the ionic interactions between their constituents.

Key words: Nanoscale ionic material, Ionic interaction, Rheological property, Strain overshoot

CLC Number:

O631

TrendMD:

LIU Yangjian, RUAN Yingbo, ZHANG Baoqing, QIAO Xin, LIU Chenyang. Tuning of Ionic Interaction and Rheological Properties of Nanoscale Ionic Materials^†[J]. Chem. J. Chinese Universities, 2016, 37(4): 767.

Figures/Tables 7

Fig.1 Titration curves for acid-base reaction between SiO2-SIT and M2070(A) or Ethomeen(B)

Fig.2 TGA curves of SiO2-SIT-M2070(A) and SiO2-SIT-Ethomeen(B)^(A) a. SiO2; b. SiO2-SIT; c. M2070. Mass fraction of SiO2 in SiO2-SIT-M2070(%): d. 20.1; e. 26.3; f. 30.7. (B) a. Ethomeen. Mass fraction of SiO2 in SiO2-SIT-Ethomeen(%): b. 20.5; c. 27.4; d. 31.7; e. 37.4; f. 44.0.

Fig.3 Representative TEM images of SiO2-SIT-M2070(A, B) and SiO2-SIT-Ethomeen(C,D)^ Mass fraction of SiO2 in the materials: (A) 20.1%; (B) 30.7%; (C) 20.5%; (D) 44.0%.

Fig.4 SAXS curves of SiO2-SIT-M2070(A) and SiO2-SIT-Ethomeen(B)^Curves shifted vertically for sake of clarity. (A) Mass fraction of SiO2 in SiO2-SIT-M2070(%): a. 20.1; b. 26.3; c. 30.7. (B) Mass fraction of SiO2 in SiO2-SIT-Ethomeen(%): a. 20.5; b. 27.4; c. 31.7; d. 37.4; e. 44.0.

Fig.5 DSC curves of SiO2-SIT-M2070(A) and SiO2-SIT-Ethomeen(B)^Curves shifted vertically for sake of clarity. (A) Mass fraction of SiO2 in SiO2-SIT-M2070(%): a. 0; b. 20.1; c. 26.3; d. 30.7. (B) Mass fraction of SiO2 in SiO2-SIT-Ethomeen(%): a. 0; b. 20.5; c. 27.4; d. 31.7; e. 37.4; f. 44.0.

Fig.6 Dynamic frequency sweep curves for SiO2-SIT-M2070(A, B) and SiO2-SIT-Ethomeen(C, D)^ (A, C) G', G″-ω; (B, D) η*-ω.

Fig.7 Dynamic strain sweep results of SiO2-SIT-M2070(A) and SiO2-SIT-Ethomeen(B, C)^ (A) G', G″-γ; (B) G', G″-γ; (C) η*-γ.

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