Abstract:

Total reflection x-ray fluorescence (TXRF) is a fairly new element analysis method. The TXRF, due to using of total reflection, reduces greatly detection limits and thus places in a leading position in area of atomic spectroscopy. Comparing with AAS, ICP-OES,ICP-MS, NAA, SRXRF and PIXE, TXRF offers superiority combined in low detection limit, small sample mass,multielement simultaneous and non-destructive analysis,greater convenience and low cost.