高等学校化学学报 ›› 2006, Vol. 27 ›› Issue (5): 805.doi:

• 研究论文 • 上一篇    下一篇

从晶体取向特点探讨ZnO薄膜的晶体不完整性

侯长民1, 黄科科1, 高忠民1, 马艳2, 杜国同2, 李向山1, 冯守华1   

  1. 1. 吉林大学无机合成与制备化学国家重点实验室, 化学学院;
    2. 吉林大学电子科学与工程学院, 集成光电子学国家重点实验室, 长春 130012
  • 收稿日期:1900-01-01 修回日期:1900-01-01 出版日期:2006-05-10 发布日期:2006-05-10
  • 通讯作者: 冯守华

Studies on Crystal Structure of ZnO Films by the Mis-orientation

HOU Chang-Min1, HUANG Ke-Ke1, GAO Zhong-Min1, MA Yan2, DU Guo-Tong2, LI Xiang-Shan1, FENG Shou-Hua 1*   

  1. 1. State Key Laboratory of Inorganic Synthesis and Preparative Chemistry, College of Chemistry;
    2. College of Electronic and Engineering, State Key Lab on Integrated Optoelectronics, Jilin University, Changchun 130012, China
  • Received:1900-01-01 Revised:1900-01-01 Online:2006-05-10 Published:2006-05-10
  • Contact: FENG Shou-Hua

摘要:

用MOCVD法在蓝宝石衬底上得到了ZnO(0002)膜, 并用XRD和SEM进行了表征. 结果表明, 薄膜中沿[0001]择优取向生长的柱状晶垂直于衬底表面, 晶柱之间存在着边界和间隙. X射线Ф扫描实验结果表明, 晶柱之间的取向偏差在3°~30°之间. X射线ω摇摆曲线和谱线宽度分析结果表明, 薄膜中的晶柱是由多个晶粒堆叠而成, 且晶粒之间的平均取向偏差也在2.6°以上. 实验结果表明, ZnO大失配度异质外延膜是c轴[0001]取向柱状多晶体, ZnO薄膜的结晶不完整性主要是由其柱状晶结构造成的.

关键词: 氧化锌薄膜; 晶体取向; 取向柱状多晶体

Abstract:

ZnO(0002) films were grown on sapphire(0006) substrate by metal-organic chemical vapor deposition(MOCVD) and were characterized by X ray diffraction(XRD) and scanning electronic microscope(SEM). SEM and XRD results show that the columnar crystals grew along caxis and were vertical to the(0006) plane of the substrate. There exist grain boundaries and grain interstitials among the crystals. The Ф scanning curves of the(10-13) plane for ZnO films show that the misorientation among columnar crystals ranged from 3° to 30°. The full wide at half maximum(FWHM) of rocking curves of(0002) plane for the ZnO films is above 2.6°. Grain sizes at different thicknesses illustrate that the column is composed of the grains with different sizes. The big mismatch heteroepilayer ZnO films are columnar polycrystals orienting along c axis.

Key words: ZnO films; Crystal orientation; Columnar poly-crystals

中图分类号: 

TrendMD: