高等学校化学学报

高等学校化学学报 ›› 1988, Vol. 9 ›› Issue (9): 976.

• 论文 • 上一篇    下一篇

多阶半微分阴极溶出伏安法测定痕量硒(Ⅳ)的研究

周漱萍, 董文举   

  1. 河南师范大学化学系
  • 收稿日期:1987-01-04 出版日期:1988-09-24 发布日期:1988-09-24
  • 通讯作者: 周漱萍

Studies on the Determination of Trace Selenium (Ⅳ) by the Multiple Semidifferential Cathodic Stripping Voltammetry

Zhou Shuping, Dong Venju   

  1. Department of Chemistry, Benan Normal University, Xinxiang
  • Received:1987-01-04 Online:1988-09-24 Published:1988-09-24

PDF (PC)

被引次数

3

摘要： 阴极溶出伏安法测定痕量硒已有报导[1~5],但准确度不佳,灵敏度还嫌不够。本文研究了盐酸和铜体系测定硒,在适宜条件,测定硒的浓度范围为0.04～20ng/mL,检测限为pg/mL级,硒含量在0.14ng/mL,变动系数小于10％。用拟定的方法测定了低硒地区水样及含硒量较高的粮食和人发,均获得了满意结果。

关键词: 溶出伏安法, 测定硒(Ⅳ)

Abstract: This paper describehe the determination of Se(Ⅳ) in 0.5 mol/L HCl-4μg/mL Cu(Ⅱ) solution by title metthod. The height of the strpping peak can be deter-mined at -0.54 or -0.63 V (vs. SCE), determined concentration range is 0.04- 20ng/mLof Se, and the pre-electrolytic potential, is -0.25 or -0.35 V. The detection limit is pg/mLlevel. The relative standard deviation is 7.1% at the concentration of Se(Ⅳ) 0.14 ng/mL.The reaction process and behavior of the cathodic stripping peaks have been studied and discussed.

Key words: Cathodic stripping voltairmetry, Deleron, minatiSelcnium(Ⅳ)

TrendMD: