高等学校化学学报 ›› 2000, Vol. 21 ›› Issue (S1): 21.
• Analytical Sciences • 上一篇 下一篇
HAN Yan-Chun1, SCHMITT Stefan2, FRIEDRICH Klaus2
HAN Yan-Chun1, SCHMITT Stefan2, FRIEDRICH Klaus2
摘要:
Atomic force microscopy (AFM) and its modification-lateral force microscope (LFM) are becoming increasingly important in the understanding of microfriction and nanomechanical property measurements. In the present paper, the AFM, LFM and a modified AFM-lithography technique are described, and data on microtribilogical studies of PEEK are presented. For comparisons, macro-scale friction measurements were also made on PEEK by the use of a block-on-ring testing facility. It was observed that macro-scale friction is higher than that on the microscale. Lower value of micro-scale friction as compared to macro-scale fiction may be because of less ploughing contribution in the micro-scale measurement.
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