Abstract: The morphologies of the silver iodobromide T-grain crystal surface, the doped emulsion crystal surface with the dopant K₄[Ru(CN) 6] and the sulfur plus gold sensitized doped emulsion crystal surface were observed. The effects of the light exposure on above crystal surfaces were also studied with AFM. The results show that while the grain surfaces appear to be flat when observed with a common electron microscope or an atomic force microscope with a low resolution power, many hills were revealed on the crystal surface with a high resolution power. After exposure the in situ observation showed that both the heights and sizes of the hills increased. The dopant might affect the amount of the hills. After sulfur plus gold sensitization, the arrangement of the hills turned more regular.

Key words: AFM, T-grain crystal, Surface morphology, Shallow electron trapping dopant