Abstract:

The insufficient energy resolution of detectors is the reason of effect of interelement influence, which reduces a precision in energy-dispersive X-ray fluorescence analysis (XRED) with semi-conductor detectrs and new method of total external reflection (TXRF) which ensures record sensitivity - up to (10^-11-10^-13) g. Taking into account this effect is a necessary stage of existing analysis techniques which tend to ensure identity of composition of sample and standard or use decomposition of a multiple on components on spectra of the monostandards. However, an impossibility to achieve an absolute identity of sample composition as well as fluctuations of the energy resolution result in serious errors and do not allow to analyze and take into consideration the effect of elements not present in composition of the standards.