Chem. J. Chinese Universities ›› 2003, Vol. 24 ›› Issue (6): 1136.

• Preface • Previous Articles     Next Articles

Preparation and Characterization of Orderly Alternating TiO2/CTAB Multilayer Film

ZHANG Sheng-Mao1,2, ZHANG Zhi-Jun2, DANG Hong-Xin1,2, LIU Wei-Min1, XUE Qun-Ji1   

  1. 1. State Key Laboratory of Solid Lubrication, Lanzhou Institute of Chemical Physics, Chinese Academy of Sciences, Lanzhou 730000, China;
    2. Laboratory of Special Functional Materials, Henan University, Kaifeng 475001, China
  • Received:2002-04-25 Online:2003-06-24 Published:2003-06-24

Abstract: The composite thin film of TiO2/CTAB was prepared on quartz substrate bYUsing super-molecular self-assembly method. The structure of the thin film was characterized by means of X-ray diffraction and UV-Vis absorption spectrum. The results of UV-Vis absorption spectrum indicate that the diameter of the TiO2 nanoparticles is 2 nm. The results of X-ray diffraction indicate that the thin film is composed of organic and inorganic layers in alternately orderly arrangement. The distance between the organic layer and inorganic layer is 4.61 nm. The thicknesses of organic layer and inorganic layer are 2.58 and 2 nm, respectively.

Key words: TiO2, Cetyltrimethyl ammonium bromide(CTAB), Super-molecular self-assembly, X-ray diffraction, UV-Vis absorption spectrum

CLC Number: 

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