Chem. J. Chinese Universities ›› 2001, Vol. 22 ›› Issue (5): 836.

• Articles • Previous Articles     Next Articles

Studies on Interface Structure of BBDMS-PPV/ITO System Using ADXPS Technique

SONG Wei-Jie1, ZHU Yong-Fa1, CAO Li-Li1, LI Zhan-Ping2, WANG Dao-Yuan2, Huang-Wei3   

  1. 1. Department of Chemistry, Tsinghua University, Beijing 100084, China;
    2. ULVAC PHI, Inc. 2500 Hagisono, Chigasaki Shi, Kanagawa Ken 253, Japan;
    3. Institute Material Research & Engineering, National University of Singapore, Singapore 119260
  • Received:2000-04-19 Online:2001-05-24 Published:2001-05-24

Abstract: We analyzed the structure of buried interface of BBDMS-PPV/ITOsystem using a high resolution ADXPStechnique. Atransitional layer structure, whose chemical composition, state and valence band changed gradually from BBDMS-PPVsurface of film to substrate ITO, was observed. It was found that O2- ion from ITOdiffused into polymer film, interacted with back bone carbon and formed the carbonyl bonding which could possibly constructed the channel of the carrier on the heterointerface. Indium of ITOalso diffused into BBDMS-PPVlayer and In(OH)3 was formed during diffusion. The diffusion and reaction between PPV/ITOinterface may affect the performance of PLEDsignificantly.

Key words: PPV/ITO interface, Interface structure, Interface analysis, ADXPS

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