Chem. J. Chinese Universities ›› 1991, Vol. 12 ›› Issue (8): 1122.

• Articles • Previous Articles     Next Articles

X-Ray Diffraction Studies of Pyrolytic Products of Phenol-Formaldehyde Resins

Xie De-min, Wang Rong-shun, Zhang Xi-yan, Fu Yu-jie, Wang Cun-guo, Zhao Cheng-da, Mu Zhong-cheng   

  1. Department of Chemistry, Northeast Normal University, Changchun, 130024;
    2. Analytical Test Center, Northeast Normal University, Changchun
  • Received:1990-08-14 Online:1991-08-24 Published:1991-08-24

Abstract: X-ray diffraction method has been used to study pristine and doped polyacenic semiconduc-tive materials prepared by pyroiytic treatment of phenol-formaldehyde (PF) and paracresol-formalde-hyde (PCF) resins. The results show that pyroiytic products of PFdisplay a polycrystalline structure and the interlayer distance is shortened with increasing TP. The pristine samples obtined by pyrolysis of PFresin containing ZnCl2in advance are amorphous, ZnCl2plays a role of porous structure formation , increasing specific surface area and the values of dcin all iodine-doped samples are increased in comparison with those of the pristine samples. The pristine samples obtained by pyrolysis of PCF resin show also amorphous structure but the value of dcdoes not change significantly.

Key words: Polyacene, X-ray diffraction, Phenol-formaldehyde resins, Paracresol-formaldehyde resins

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