硅表面有机单分子膜的新表征方法──界面微分电容测量法
孙乔玉, Catherine Henry de Villeneuve, 力虎林, Philippe A llongue
A New Technique of the Characterization of Monolayers on Silicon Surfaces──Measure of the Differential Capacity of Interfaces
SUN Qiao-Yu, Henry de Villeneuve Catherine, LI Hu-Lin, Allongue Philippe
高等学校化学学报
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2003, (1): 86
-90
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