Chem. J. Chinese Universities ›› 2005, Vol. 26 ›› Issue (10): 1926.

• Articles • Previous Articles     Next Articles

Photoluminescence Property of InAs Quantum Dots with InxGa1-xAs Layer Inserted

YANG Jing-Hai1,2, GONG Jie1,3, YANG Li-Li1, FAN Hou-Gang1, ZHAO Qing-Xiang4   

  1. 1. Institute of Condensed State Physics,Jilin Normal University,Siping 136000,China;
    2. College of Materials Science and Engineering,Jinlin University,Changchun 130023,China;
    3. Applied Science and Technolyogy College,Changchun University,Changchun 130022,China;
    4. Department of Physics,Chalmers University,S-41296 Gteborg,Sweden
  • Received:2004-08-15 Online:2005-10-10 Published:2005-10-10

Abstract: InAs quantum dots(QDs) have been grown on the GaAs(001)substrates by the method of molecular beam epitaxy.The emission of InAs QDs can be turned to about 1 300 nm by the introduction of a 10ML In0.4Ga0.6As layer.The photoluminescence of the samples were studied before and after being treated by(hydrogen) plasma.The results show that the enhancement of the PL intensity after H-plasma treatment(depends) on the excitation power,from about a factor of 12 at the low excitation limit to about a factor of 2 at the highest excitation power used in this study,which are probably due to competition between carrier capture by nonradiative centers and InAs QDs.PL intensity variation with the chauge of time and temperature were also investigated,and the results of them clearly illustrate that there indeed exist interface defects,both on the interface(between) the InAs dots and surrounding layers and in the GaAs layers,which can be suppressed heavily by H-treatments so that the PL intensity can be enhanced greatly.

Key words: InAs quantum dots, Interface defects, Photoluminescence

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