Chem. J. Chinese Universities ›› 2003, Vol. 24 ›› Issue (1): 86.

• Preface • Previous Articles     Next Articles

A New Technique of the Characterization of Monolayers on Silicon Surfaces──Measure of the Differential Capacity of Interfaces

SUN Qiao-Yu1,2, Henry de Villeneuve Catherine2, LI Hu-Lin1, Allongue Philippe2   

  1. 1. College of Chemistry and Chemical Engineering, Lanzhou University, Lanzhou 730000, China;
    2. Laboratoire de Physique des Liquides et Electrochimie, CNRS-UPR 15 Conventionnée avec l′Université P & M Curie, 4 place Jussieu, Tour 22, 75005 Paris
  • Received:2001-09-04 Online:2003-01-24 Published:2003-01-24
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Abstract: We suggest a new technique to characterize the organic monolayers on silicon surfacesmeasurement of the differential capacity-electrode potential curve. By means of the investigation of differential capacity of a series of alkenes-modified silicon surfaces and H-Si(111)/electrolyte interfaces, we have established the relationship between the structure of the organic monolayers on silicon surfaces and their interface differential capacity. It has been confirmed to be a simple, quick, and effective experimental technique for the research of chemical modifications and functions on the silicon surfaces.

Key words: Monolayers on silicon surfaces, Differential capacity, Characteristic technique

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