A New Technique of the Characterization of Monolayers on Silicon Surfaces──Measure of the Differential Capacity of Interfaces
SUN Qiao-Yu1,2, Henry de Villeneuve Catherine2, LI Hu-Lin1, Allongue Philippe2
1. College of Chemistry and Chemical Engineering, Lanzhou University, Lanzhou 730000, China;
2. Laboratoire de Physique des Liquides et Electrochimie, CNRS-UPR 15 Conventionnée avec l′Université P & M Curie, 4 place Jussieu, Tour 22, 75005 Paris
SUN Qiao-Yu, Henry de Villeneuve Catherine, LI Hu-Lin, Allongue Philippe . A New Technique of the Characterization of Monolayers on Silicon Surfaces──Measure of the Differential Capacity of Interfaces[J]. Chem. J. Chinese Universities, 2003, 24(1): 86.