Abstract: Doped ZnOceramics have complicated XRDdiffraction patterns. It is difficult to carry out qualitative, quantitative phase analysis and to determine the crystalline size and micro strain of them with traditional methods. Here we used Rietveld whole pattern fitting method to analyze them. The composition of spinel varied when the proportion of adulterant changes and it was detemined by whole pattern fitting. All the results were obtained simultaneously in fitting. Therefore the time for data processing was shorter than that the traditional methods need. And the results were more accurate than that obtained by traditional method. It was found that ceramics consist mainly of bigger ZnOgrains (the lattice parameters of them are close to those in pure ZnOso they are not doped with other metals), and intergranular high dispersive Bi₂O₃ and spinel grains.

Key words: Doped ZnO ceramics, Rietveld whole pattern fitting, Structure characterization